Improving coverage for EUC outliers: variables include the number of outputs tested at one time and spikes in.(TEST AND INSPECTION): An article from: Printed Circuit Design & Fab

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Citation Details
Title: Improving coverage for EUC outliers: variables include the number of outputs tested at one time and spikes in.(TEST AND INSPECTION)
Author: Cynthia Chuah
Publication:Printed Circuit Design & Fab (Magazine/Journal)
Date: February 1, 2012
Publisher: UP Media Group, Inc.
Volume: 29 Issue: 2 Page: 62(2)

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