Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach: 1st (First) Edition

Name: Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach: 1st (First) Edition
Author: Edward B. Hakim, Michael Pecht Pradeep Lall
ISBN: 978B0086PULS6

Author Edward B. Hakim, Michael Pecht Pradeep Lall

Publisher CRC Press

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Book Details

Author(s) Edward B. Hakim, Michael Pecht Pradeep Lall

Publisher CRC Press

ISBN / ASIN B0086PULSC

ISBN-13 978B0086PULS6

Marketplace France 🇫🇷