[(Power-constrained Testing of Vlsi Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Apr-2003]

Name: [(Power-constrained Testing of Vlsi Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Apr-2003]
Author: Nicola Nicolici
ISBN: 978B010DSZMH9

Author Nicola Nicolici

Publisher Kluwer Academic Publishers

Shop on Amazon — pick your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

Buy Now Used — $502.29

Book Details

Author(s) Nicola Nicolici

Publisher Kluwer Academic Publishers

ISBN / ASIN B010DSZMHO

Sales Rank #99,999,999

Marketplace United States

Ratings & Reviews No reviews yet — be the first!

No reviews yet.

More of EbookNetworking

Book seriesVolume one to the last, in order Free PDFs82,000+ papers, manuals and out-of-print scans Best dealsBargain copies under $5, six marketplaces Reading clubsRead one book together, chapter by chapter

← Previous in United States El que no et mata et fa més... Next in United States Global Energy Strategies: L... →

← Previous · United States El que no et mata...

Next · United States Global Energy Str... →

[(Power-constrained Testing of Vlsi Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Apr-2003]

More Books by Nicola Nicolici

More of EbookNetworking