Built In Test for VLSI: Pseudorandom Techniques by Paul H. Bardell (1987-10-03)

Name: Built In Test for VLSI: Pseudorandom Techniques by Paul H. Bardell (1987-10-03)
Author: Paul H. Bardell;W. H. McAnney;J. Savir
ISBN: 978B01F9QFMS2

Author Paul H. Bardell;W. H. McAnney;J. Savir

Publisher Wiley-Interscience

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Book Details

Author(s) Paul H. Bardell;W. H. McAnney;J. Savir

Publisher Wiley-Interscience

ISBN / ASIN B01F9QFMSY

ISBN-13 978B01F9QFMS2

Marketplace India 🇮🇳