CSN EN 61967-8 - Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method Buy on Amazon

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CSN EN 61967-8 - Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

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ISBN / ASINB01FXB2OYA
ISBN-13978B01FXB2OY3
MarketplaceCanada  🇨🇦

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EN 61967-8 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method - IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This publication is to be read in conjunction with IEC 61967-1:2002.Original English text of CSN EN Standard.The price of the Standard included all amendments and correcturs.

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