VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

• Most up-to-date coverage of design for testability.
• Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. 
• Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

• Design-For-Test For Digital IC's and Embedded Core Systems
• Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing)
• System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability (Systems on Silicon)
• Computer Architecture: A Quantitative Approach
• Low Power Design Essentials (Integrated Circuits and Systems)
• Digital Systems Testing & Testable Design
• Electronic Design Automation: Synthesis, Verification, and Test (Systems on Silicon)
• Analog IC Design with Low-Dropout Regulators, Second Edition
• Skew-Tolerant Circuit Design (The Morgan Kaufmann Series in Computer Architecture and Design)
• Logical Effort: Designing Fast CMOS Circuits (The Morgan Kaufmann Series in Computer Architecture and Design)