Rapid Reliability Assessment of VLSICs
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Book Details
Author(s)Dorey, A.P.
PublisherSpringer
ISBN / ASIN030643492X
ISBN-139780306434921
AvailabilityOnly 1 left in stock - order soon.
CategoryComputers
MarketplaceUnited States 🇺🇸
Description ▲
Describes methods of assessing the quality and reliability of VLSICs (very large scale integrated circuits) using sensitive, non-destructive, electrical measurements. A selection of tests has been devised and evaluated on relatively small scale integrated digital circuits made with CMOS technology.
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