Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference, STM'03 (AIP Conference Proceedings)
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Book Details
PublisherAmerican Institute of Physics
ISBN / ASIN0735401683
ISBN-139780735401686
AvailabilityUsually ships in 24 hours
Sales Rank13,770,530
CategoryScience
MarketplaceUnited States 🇺🇸
Description ▲
At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.
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