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Semiconductor Memories: Technology, Testing, and Reliability

Author Ashok K. Sharma
Publisher Wiley-IEEE Press
Category Technology & Engineering
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Book Details
ISBN / ASIN0780310004
ISBN-139780780310001
AvailabilityUsually ships in 24 hours
Sales Rank2,356,384
MarketplaceUnited States 🇺🇸

Description

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
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