A Probabilistic Analysis of Test Response Compaction
📄 Viewing lite version
Full site ›
Book Details
Author(s)Slawomir Pilarski, Tiko Kameda
ISBN / ASIN0818665327
ISBN-139780818665325
Sales Rank2,970,793
CategoryComputers
MarketplaceUnited States 🇺🇸
Description ▲
Synthesizes recent findings on the chance of missing a faulty circuit when the data from testing microelectronic systems is compacted to be more manageable, a situation known as aliasing. Considers single and multiple stuck-at, delay, and stuck-open faults. Also reviews the testing of VLSI, introduc
More Books in Computers
Windows XP, Vol. 1 (SELECT Series)
View
Internet Searching and Indexing: The Subject Approach
View
Control Problems in Industry: Proceedings from the SIA…
View
Open Source Systems Security Certification
View
Java: Data Structures and Programming
View
User-Centered Web Development
View
Query Processing in Database Systems (Topics in Inform…
View
Fundamentals of SQL Server 2005
View
Dreamweaver CS4: The Missing Manual (Spanish Edition)
View