A Probabilistic Analysis of Test Response Compaction
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Book Details
Author(s)Slawomir Pilarski, Tiko Kameda
ISBN / ASIN0818665327
ISBN-139780818665325
Sales Rank2,970,793
CategoryComputers
MarketplaceUnited States 🇺🇸
Description ▲
Synthesizes recent findings on the chance of missing a faulty circuit when the data from testing microelectronic systems is compacted to be more manageable, a situation known as aliasing. Considers single and multiple stuck-at, delay, and stuck-open faults. Also reviews the testing of VLSI, introduc
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