Selected Papers on Optical Methods in Surface Metrology (SPIE Milestone Series Vol. MS129)

Name: Selected Papers on Optical Methods in Surface Metrology (SPIE Milestone Series Vol. MS129)
Author: David J. Whitehouse
ISBN: 9780819423474

Author David J. Whitehouse

Publisher SPIE Press

📄 Viewing lite version Full site ›

🌎 Shop on Amazon — choose country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

113.05 119.00 USD

🛒 Buy New on Amazon 🇺🇸 🏷 Buy Used — $209.00

✓ Usually ships in 24 hours

Book Details

Author(s)David J. Whitehouse

PublisherSPIE Press

ISBN / ASIN0819423475

ISBN-139780819423474

AvailabilityUsually ships in 24 hours

Sales Rank12,606,742

MarketplaceUnited States 🇺🇸

Description ▲

Topics in this volume include: comparison of interferometric contouring techniques; comparison of visibility of standard scratches; and near-grazing illumination and shadowing of rough surfaces.