Advances in Metrology for X-Ray and EUV Optics III: 1-2 August 2010, San Diego, California, United States

Name: Advances in Metrology for X-Ray and EUV Optics III: 1-2 August 2010, San Diego, California, United States
Author: Lahsen Assoufid
ISBN: 9780819482976

Author Lahsen Assoufid

Publisher SPIE Press

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Book Details

Author(s)Lahsen Assoufid

PublisherSPIE Press

ISBN / ASIN0819482978

ISBN-139780819482976

Sales Rank99,999,999

MarketplaceUnited States 🇺🇸