Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V: 24-25 August 2011, San Diego, California, United States

Name: Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V: 24-25 August 2011, San Diego, California, United States
Author: Michael T. Postek
ISBN: 9780819487155

Author Michael T. Postek

Publisher SPIE Press

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Book Details

Author(s)Michael T. Postek

PublisherSPIE Press

ISBN / ASIN0819487155

ISBN-139780819487155

Sales Rank99,999,999

MarketplaceUnited States 🇺🇸