Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V: 24-25 August 2011, San Diego, California, United States

Name: Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V: 24-25 August 2011, San Diego, California, United States
Author: Michael T. Postek
ISBN: 9780819487155

Author Michael T. Postek

Publisher SPIE Press

📄 Viewing lite version Full site ›

🌎 Shop on Amazon — choose country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

⌛ 🇫🇷 France pricing being fetched… Prices will appear once fetched — usually within a few minutes.

View in: 🇺🇸 USA

Book Details

Author(s)Michael T. Postek

PublisherSPIE Press

ISBN / ASIN0819487155

ISBN-139780819487155

MarketplaceFrance 🇫🇷