Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI: 23-24 January 2012, San Francisco, California, United States

Name: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI: 23-24 January 2012, San Francisco, California, United States
Author: Sonia Garcia-Blanco
ISBN: 9780819488930

Author Sonia Garcia-Blanco

Publisher SPIE Press

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Book Details

Author(s)Sonia Garcia-Blanco

PublisherSPIE Press

ISBN / ASIN0819488933

ISBN-139780819488930

Sales Rank99,999,999

MarketplaceUnited States 🇺🇸

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI: 23-24 January 2012, San Francisco, California, United States

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