Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI: 23-24 January 2012, San Francisco, California, United States
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Book Details
Author(s)Sonia Garcia-Blanco
PublisherSPIE Press
ISBN / ASIN0819488933
ISBN-139780819488930
MarketplaceFrance 🇫🇷