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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach (Circuits, Devices and Systems)

Publisher The Institution of Engineering and Technology
Category Technology & Engineering
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Book Details
ISBN / ASIN0863417450
ISBN-139780863417450
AvailabilityUsually ships in 2-3 business days
Sales Rank7,232,544
MarketplaceUnited States 🇺🇸

Description

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
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