ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery [With CDROM]
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Book Details
Author(s)ASM International
PublisherASM International
ISBN / ASIN0871708639
ISBN-139780871708632
AvailabilityUsually ships in 24 hours
Sales Rank12,746,711
MarketplaceUnited States 🇺🇸