Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)

Name: Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)
Author: Angela Krstic, Kwang-Ting (Tim) Cheng
ISBN: 9781461375616

Author Angela Krstic, Kwang-Ting (Tim) Cheng

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Book Details

Author(s)Angela Krstic, Kwang-Ting (Tim) Cheng

ISBN / ASIN1461375614

ISBN-139781461375616

MarketplaceUnited States 🇺🇸