Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)
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Book Details
Author(s)Breitenstein, Otwin
PublisherSpringer
ISBN / ASIN3642264786
ISBN-139783642264788
AvailabilityOut of Print--Limited Availability.
CategoryPaperback
MarketplaceUnited States 🇺🇸
Description ▲
Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation.
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