Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications (Springer Series in Materials Science)
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Book Details
PublisherSpringer
ISBN / ASIN3662520540
ISBN-139783662520543
AvailabilityUsually ships in 1-2 business days
Sales Rank99,999,999
CategoryScience
MarketplaceUnited States 🇺🇸
Description ▲
This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.
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