Search Books

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

Author Andrei Pavlov, Manoj Sachdev
📄 Viewing lite version Full site ›
🌎 Shop on Amazon — choose country
199.00 USD
🛒 Buy New on Amazon 🇺🇸
Share:
Book Details
ISBN / ASIN904817855X
ISBN-139789048178551
MarketplaceUnited States 🇺🇸