CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)
📄 Viewing lite version
Full site ›
199.00
USD
🛒 Buy New on Amazon 🇺🇸
Book Details
Author(s)Andrei Pavlov, Manoj Sachdev
ISBN / ASIN904817855X
ISBN-139789048178551
MarketplaceUnited States 🇺🇸