RYE: A realistic yield simulator for VLSIC structural failures (Research report / SRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering)

Name: RYE: A realistic yield simulator for VLSIC structural failures (Research report / SRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering)
Author: Ihao Chen
ISBN: 978B00071UHA0

Author Ihao Chen

Publisher SRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering, Car

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Book Details

Author(s)Ihao Chen

PublisherSRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering, Car

ISBN / ASINB00071UHAA

ISBN-13978B00071UHA0

Sales Rank99,999,999

MarketplaceUnited States 🇺🇸