This digital document is a journal article from Reliability Engineering and System Safety, published by Elsevier in 2007. The article is delivered in HTML format and is available in your Amazon.com Media Library immediately after purchase. You can view it with any web browser.
Description:
The problem addressed is how to combine event experience data from multiple source plants to estimate common cause failure (CCF) rates for a target plant. Alternative models are considered for transforming CCF parameters from systems with different numbers of similar components to obtain CCF-rates for a specific group of components. Two sets of rules are reviewed and compared for transforming rates and assessment uncertainties from larger to smaller systems, i.e. mapping down. Mapping down equations are presented also for the alpha-factors and for the variances of CCF rates. Consistent rules are developed for mapping up CCF-rates and uncertainties from smaller to larger systems. These mapping up rules are not limited to a binomial CCF model. It is shown how consistency requirements set certain limits to possible parametric values. Empirical alpha factors are used to estimate robust mapping parameters, and mapping up equations are derived for alpha factors as well. An assessment uncertainty procedure is presented for treating incomplete or vague information when estimating CCF-rates. Numerical studies illustrate mapping rules and procedures. Recommendations are made for practical applications.
Consistent mapping of common cause failure rates and alpha factors [An article from: Reliability Engineering and System Safety]
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Book Details
Author(s)J.K. Vaurio
PublisherElsevier
ISBN / ASINB000PDSP6I
ISBN-13978B000PDSP64
MarketplaceFrance 🇫🇷