Search Books

Consistent mapping of common cause failure rates and alpha factors [An article from: Reliability Engineering and System Safety]

Author J.K. Vaurio
📄 Viewing lite version Full site ›
🌎 Shop on Amazon — choose country
⌛ 🇮🇳 India pricing being fetched… Prices will appear once fetched — usually within a few minutes.
Share:
Book Details
Author(s)J.K. Vaurio
ISBN / ASINB000PDSP6I
ISBN-13978B000PDSP64
MarketplaceIndia 🇮🇳