Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)

Name: Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)
Author: Nicola Nicolici, Bashir M. Al-Hashimi
ISBN: 978B000WEFNN2

Author Nicola Nicolici, Bashir M. Al-Hashimi

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Book Details

Author(s)Nicola Nicolici, Bashir M. Al-Hashimi

ISBN / ASINB000WEFNN8

ISBN-13978B000WEFNN2

MarketplaceUnited States 🇺🇸