[(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010]

Name: [(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010]
Author: Nicola Nicolici
ISBN: 978B010DSZP78

Author Nicola Nicolici

Publisher Springer-Verlag New York Inc.

📄 Viewing lite version Full site ›

🌎 Shop on Amazon — choose country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

⌛ 🇩🇪 Germany pricing being fetched… Prices will appear once fetched — usually within a few minutes.

View in: 🇺🇸 USA

Book Details

Author(s)Nicola Nicolici

PublisherSpringer-Verlag New York Inc.

ISBN / ASINB010DSZP7G

ISBN-13978B010DSZP78

MarketplaceGermany 🇩🇪