[(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010]

Name: [(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010]
Author: Nicola Nicolici
ISBN: 978B010DSZP78

Author Nicola Nicolici

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Book Details

Author(s)Nicola Nicolici

ISBN / ASINB010DSZP7G

ISBN-13978B010DSZP78

MarketplaceUnited Kingdom 🇬🇧