#92 · Advances in Imaging and Electron Physics, Volume 92
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#101 · Advances in Imaging and Electron Physics, Volume 101 (Srlances in Imaging & Electron Physics)
#102 · Advances in Imaging and Electron Physics, Volume 102
#106 · Advances in Imaging and Electron Physics, Volume 106 (Srlances in Imaging & Electron Physics)
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#112 · Advances in Imaging and Electron Physics, Volume 112 (Advances in Imaging & Electron Physics)
#113 · Advances in Imaging and Electron Physics, Volume 113 (Srlances in Imaging & Electron Physics)
#114 · Advances in Imaging and Electron Physics, Volume 114 (Srlances in Imaging & Electron Physics)
#115 · Advances in Imaging and Electron Physics, Volume 115
#116 · Advances in Imaging and Electron Physics, Volume 116 (Srlances in Imaging & Electron Physics)
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#120 · Advances in Imaging and Electron Physics, Volume 120 (Srlances in Imaging & Electron Physics)
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#159 · Advances in Imaging and Electron Physics, Volume 159: The scanning transmission electron microscope
#162 · Advances in Imaging and Electron Physics, Volume 162: Optics of Charged Particle Analyzers
#163 · Advances in Imaging and Electron Physics, Volume 163: Optics of Charged Particle Analyzers
#164 · Advances in Imaging and Electron Physics, Volume 164
#165 · Advances in Imaging and Electron Physics, Volume 165
#166 · Advances in Imaging and Electron Physics, Volume 166: Theory of Intense Beams of Charged Particles
#167 · Advances in Imaging and Electron Physics, Volume 167
#168 · Advances in Imaging and Electron Physics, Volume 168: Optics of Charged Particle Analyzers
#169 · Advances in Imaging and Electron Physics, Volume 169
#171 · Advances in Imaging and Electron Physics, Volume 171
#172 · Advances in Imaging and Electron Physics, Volume 172: Part A
#173 · Advances in Imaging and Electron Physics, Volume 173: Part B
#174 · Advances in Imaging and Electron Physics, Volume 174: Silicon-Based Millimetre-wave Technology
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This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
