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Scanning Electron Microscopy and X-ray Microanalysis: Third Edition

AuthorJoseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
PublisherSpringer
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Book Details

Author(s)Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
PublisherSpringer
ISBN / ASIN0306472929
ISBN-139780306472923
MarketplaceUnited States  🇺🇸

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Scanning Electron Microscopy and X-ray Microanalysis: Third Edition
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