Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) Buy on Amazon
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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)

Author Wayne B. Nelson
Publisher Wiley-Interscience
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Book Details
Author(s) Wayne B. Nelson
Publisher Wiley-Interscience
ISBN / ASIN 0471522775
ISBN-13 9780471522775
Marketplace France 🇫🇷
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