Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) by Wayne B. Nelson (1990-02-23) Buy on Amazon

Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) by Wayne B. Nelson (1990-02-23)

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Book Details
Author(s) Wayne B. Nelson
Publisher Wiley-Interscience
ISBN / ASIN B01NANDC3Z
ISBN-13 978B01NANDC30
Marketplace France 🇫🇷
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