Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) by Wayne B. Nelson (1990-02-23) Buy on Amazon
Facebook LinkedIn

Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) by Wayne B. Nelson (1990-02-23)

Price not available for India

You can still browse on Amazon. Try another country above.

Book Details
Author(s) Wayne B. Nelson
Publisher Wiley-Interscience
ISBN / ASIN B01NANDC3Z
ISBN-13 978B01NANDC30
Marketplace India 🇮🇳
Donate to EbookNetworking
No Prev
No Next