Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction; X-Ray, Electron and Ion Spectrometry; Electron Microscopy
Book Details
Author(s)Eberhart, J. P.
PublisherWiley-Blackwell
ISBN / ASIN0471929778
ISBN-139780471929772
AvailabilityOnly 1 left in stock.
CategoryTechnology & Engineering
MarketplaceCanada 🇨🇦

