Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction; X-Ray, Electron and Ion Spectrometry; Electron Microscopy Buy on Amazon
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Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction; X-Ray, Electron and Ion Spectrometry; Electron Microscopy

Publisher Wiley
Book Details
Author(s) J. P. Eberhart
Publisher Wiley
ISBN / ASIN 0471929778
ISBN-13 9780471929772
Sales Rank #15,245,706
Marketplace United States 🇺🇸
Description
An extraordinary development in techniques for studying and testing materials has occurred in recent years. Provides a basic knowledge of these material analysis methods. It is a comprehensive and coherent survey of the theory and practice of the most important of these techniques based on X-ray, electron and ion spectrometry, on the various imaging methods and electron microscopies, including scanning tunneling microscopy.
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