Memory Technology, Design and Testing: 2000 IEEE International Workshop
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Book Details
Author(s)
Design and Testing (8th : 2000 : San Jose, Calif.) IEEE International Workshop on Memory Technology
Publisher
Ieee
ISBN / ASIN
0769506895
ISBN-13
9780769506890
Marketplace
France 🇫🇷
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Description
Nineteen papers and a keynote address comprise the proceedings of this August 2000 workshop. The papers are organized into sections on failure mechanisms and defects, flash and EEPROM design, new ideas, test and yield, memory testing and built-in self-test, memory design, and diagnosis. Specific top
