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Fundamental Aspects of Ultrathin Dielectrics on Si-based De…
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Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices (Nato Science Partnership Subseries: 3 (closed))
Publisher
Springer
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Book Details
Publisher
Springer
ISBN / ASIN
0792350073
ISBN-13
9780792350071
Marketplace
France 🇫🇷
Description
An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of
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