Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of Spie)

Name: Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of Spie)
Author: Michael T. Postek, John A. Allgair,
ISBN: 9780819472625

Author Michael T. Postek, John A. Allgair,

Publisher Society of Photo Optical

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Book Details

Author(s) Michael T. Postek, John A. Allgair,

Publisher Society of Photo Optical

ISBN / ASIN 081947262X

ISBN-13 9780819472625

Marketplace United States 🇺🇸

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