https://www.ebooknetworking.net/books_detail-081947262X.html

Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of Spie)

Name: Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of Spie)
Author: Michael T. Postek, John A. Allgair,
ISBN: 9780819472625

AuthorMichael T. Postek, John A. Allgair,

PublisherSociety of Photo Optical

Shop on Amazon — choose your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

Buy New on Amazon 🇫🇷

Book Details

Author(s)Michael T. Postek, John A. Allgair,

PublisherSociety of Photo Optical

ISBN / ASIN081947262X

ISBN-139780819472625

MarketplaceFrance 🇫🇷