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Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of Spie)

Name: Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of Spie)
Author: Michael T. Postek, John A. Allgair,
ISBN: 9780819472625

AuthorMichael T. Postek, John A. Allgair,

PublisherSociety of Photo Optical

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Book Details

Author(s)Michael T. Postek, John A. Allgair,

PublisherSociety of Photo Optical

ISBN / ASIN081947262X

ISBN-139780819472625

MarketplaceUnited States 🇺🇸