The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition

Name: The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition
Author: Department of Commerce
ISBN: 9781494743581

Author Department of Commerce

Publisher CreateSpace Independent Publishing Platform

Shop on Amazon — pick your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

Buy New on Amazon 🇫🇷

Price not available for France

You can still browse on Amazon. Try another country above.

🇺🇸 USA

Book Details

Author(s) Department of Commerce

Publisher CreateSpace Independent Publishing Platform

ISBN / ASIN 1494743582

ISBN-13 9781494743581

Marketplace France 🇫🇷

Ratings & Reviews No reviews yet — be the first!

No reviews yet.

Description

This Special Publication summarizes the certification procedure for a new generation of silicon resistivity Standard Reference Materials 2541 through 2547.