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The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition

Name: The Certification of 100 mm Diameter Silicon Resistivity SRMs 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition
Author: Department of Commerce
ISBN: 9781494743581

AuthorDepartment of Commerce

PublisherCreateSpace Independent Publishing Platform

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Book Details

Author(s)Department of Commerce

PublisherCreateSpace Independent Publishing Platform

ISBN / ASIN1494743582

ISBN-139781494743581

AvailabilityUsually ships in 24 hours

Sales Rank99,999,999

MarketplaceUnited States 🇺🇸

Description

This Special Publication summarizes the certification procedure for a new generation of silicon resistivity Standard Reference Materials 2541 through 2547.