ISTFA 2014, Proceedings from the 40th International Symposium for Testing and Failure Analysis
Book Details
Author(s)
ASM International
Publisher
ASM International
ISBN / ASIN
1627080740
ISBN-13
9781627080743
Availability
Usually ships in 24 hours
Sales Rank
#1,822,431
Marketplace
United States 🇺🇸
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Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
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