Electrical and reliability characteristics of sub-micron MOSFETs with Nâ€šâ€šO nitrided gate oxides: Research project

Name: Electrical and reliability characteristics of sub-micron MOSFETs with Nâ€šâ€šO nitrided gate oxides: Research project
Author: John T Krick
ISBN: 978B0006PB6N8

Author John T Krick

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Book Details

Author(s) John T Krick

ISBN / ASIN B0006PB6N4

ISBN-13 978B0006PB6N8

Sales Rank #99,999,999

Marketplace United States 🇺🇸

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