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Electrical and reliability characteristics of sub-micron MOSFETs with Nâ€šâ€šO nitrided gate oxides: Research project

Name: Electrical and reliability characteristics of sub-micron MOSFETs with Nâ€šâ€šO nitrided gate oxides: Research project
Author: John T Krick
ISBN: 978B0006PB6N8

AuthorJohn T Krick

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Book Details

Author(s)John T Krick

ISBN / ASINB0006PB6N4

ISBN-13978B0006PB6N8

MarketplaceUnited Kingdom 🇬🇧