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Electrical and reliability characteristics of sub-micron MOSFETs with N‚‚O nitrided gate oxides: Research project Buy on Amazon

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Electrical and reliability characteristics of sub-micron MOSFETs with N‚‚O nitrided gate oxides: Research project

AuthorJohn T Krick
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Author(s)John T Krick
ISBN / ASINB0006PB6N4
ISBN-13978B0006PB6N8
MarketplaceFrance  🇫🇷
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