Assessing a Strategy's Fit with a Pattern: Pattern-Based Analysis of Disruptive Ideas

Name: Assessing a Strategy's Fit with a Pattern: Pattern-Based Analysis of Disruptive Ideas
Author: Scott D. Anthony, Mark W. Johnson, Joseph V. Sinfield, Elizabeth J. Altman
ISBN: 978B001GLLPV1

Author Scott D. Anthony, Mark W. Johnson, Joseph V. Sinfield, Elizabeth J. Altman

Publisher Harvard Business School Press

Shop on Amazon — pick your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

Buy New on Amazon 🇮🇳

Price not available for India

You can still browse on Amazon. Try another country above.

🇺🇸 USA

Book Details

Author(s) Scott D. Anthony, Mark W. Johnson, Joseph V. Sinfield, Elizabeth J. Altman

Publisher Harvard Business School Press

ISBN / ASIN B001GLLPV0

ISBN-13 978B001GLLPV1

Marketplace India 🇮🇳

Assessing a Strategy's Fit with a Pattern: Pattern-Based Analysis of Disruptive Ideas

More Books by Scott D. Anthony, Mark W. Johnson, Joseph V. Sinfield, Elizabeth J. Altman