https://www.ebooknetworking.net/books_detail-B00Z8FSNBA.html

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicolici, Nicola, Al-Hashimi, Bashir M. (2003) Hardcover

Name: Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicolici, Nicola, Al-Hashimi, Bashir M. (2003) Hardcover
Author: Nicola, Al-Hashimi, Bashir M. Nicolici
ISBN: 978B00Z8FSNB8

AuthorNicola, Al-Hashimi, Bashir M. Nicolici

PublisherSpringer

Shop on Amazon — choose your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

Buy New on Amazon 🇫🇷

Book Details

Author(s)Nicola, Al-Hashimi, Bashir M. Nicolici

PublisherSpringer

ISBN / ASINB00Z8FSNBA

ISBN-13978B00Z8FSNB8

MarketplaceFrance 🇫🇷

Description

2003