Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicolici, Nicola, Al-Hashimi, Bashir M. (2003) Hardcover
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Book Details
Author(s)
Nicola, Al-Hashimi, Bashir M. Nicolici
Publisher
Springer
ISBN / ASIN
B00Z8FSNBA
ISBN-13
978B00Z8FSNB8
Marketplace
United Kingdom 🇬🇧
Description
2003
