[(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010] Buy on Amazon
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[(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010]

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Book Details
Author(s) Nicola Nicolici
ISBN / ASIN B010DSZP7G
ISBN-13 978B010DSZP78
Marketplace France 🇫🇷
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